Explore cutting-edge electron microscopy in this four-part webinar series hosted by TESCAN, an innovator in electron microscopy for over 30 years.
The series introduces the advanced AMBER X 2 and AMBER 2 systems, highlighting improvements in Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) technology. Topics include enhanced speed, precision, and utility in materials analysis, Transmission Electron Microscopy (TEM) sample preparation, and nanoprototyping. Each session provides valuable insights into the features, applications, and benefits of these state-of-the-art systems.
Speakers
- Miloš Hrabovský, Product Marketing Manager for Materials Science-Nanoprototyping, TESCAN
- Dr. Tomáš Šamořil, Product Marketing Manager for Materials Science-Batteries, TESCAN
- Martin Sláma, Product Marketing Manager for FIB-SEM Materials Science, TESCAN
Program
Tue Aug 20
9:00 AM – 10:00 AM GMT +2 (1 hour)
New Generation FIB-SEMs for Speed, Utility, Precision – CHINESE VERSION
5:00 PM – 6:00 PM GMT +2 (1 hour)
New Generation FIB-SEMs for Speed, Utility, Precision
Thu Aug 22
9:00 AM – 10:00 AM GMT +2 (1 hour)
FIB-SEM, Redefined. Experience Speed, Precision, and Utility in 3D Multimodal Characterization – CHINESE VERSION
5:00 PM – 6:00 PM GMT +2 (1 hour)
FIB-SEM, Redefined. Experience Speed, Precision, and Utility in 3D Multimodal Characterization
Tue Sep 03
9:00 AM – 10:00 AM GMT +2 (1 hour)
Advanced TEM Sample Preparation for Materials Research – CHINESE VERSION
5:00 PM – 6:00 PM GMT +2 (1 hour)
Advanced TEM Sample Preparation for Materials Research
Thu Sep 05
9:00 AM – 10:00 AM GMT +2 (1 hour)
Utility and Precision in Nanoprototyping: Your Gateway to Rapid Development of Novel Devices – CHINESE VERSION
5:00 PM – 6:00 PM GMT +2 (1 hour)
Utility and Precision in Nanoprototyping: Your Gateway to Rapid Development of Novel Devices
