Behandelt zentrale Fragen, diskutiert aktuelle Trends, erklärt neue und bestehende Methoden und stellt die neuesten Containment-Vorschriften vor

Simplify your Scanning Electron Microscopy (SEM) sample preparation - insights into working with traditional, heat-sensitive, and air-sensitive materials, focusing on revealing the inner structure through surface polishing or cross-sectional milling with broad Ar ion beams