Simplify your Scanning Electron Microscopy (SEM) sample preparation

The webinar will cover practical techniques for preparing samples for SEM imaging and analysis using Ar ion milling. It will provide insights into working with traditional, heat-sensitive, and air-sensitive materials, focusing on revealing the inner structure through surface polishing or cross-sectional milling with broad Ar ion beams.

Speakers

• Dr. Robert Steffen, Applications Manager Hitachi High-Tech Europe
• Jürgen Simon, Sales Manager Hitachi High-Tech Europe